Direct Power Injection Model for Integrated Circuits Immunity Simulation on Power Pins

This paper introduces a complete simulation model of a direct power injection (DPI) setup, used to measure the immunity of integrated circuits to conducted continuous-wave interference. This model encompasses the whole measurement setup itself as well as the integrated circuit under test and its environment (printed circuit board, power supply). A simple example about the methodology and several DPI simulation results are shown. Simulation results obtained from the model are compared with measurement results, and these demonstrate the validity of this approach. The combined model is able to predict the immunity level more precisely and better support the immunity simulation of circuit under direct power injection (DPI) test.