Evaluation of a Large Area, 83 μm Pixel Pitch Amorphous Selenium Indirect Flat Panel Detector

Dual-layer detectors provide a low-cost solution to improved material decomposition and lesion differentiation in X-ray imaging, while eliminating motion artifacts from multiple exposures. Most designs utilize two indirect detectors with scintillators designed for low-energy and higher-energy detection and separated by a copper filter to harden the beam for high energy detection. To improve the performance of the bottom detector and lower dose requirements, we have previously proposed an alloyed amorphous selenium photodetector to achieve improved resolution and absorption at green wavelengths, better suited to high-performance scintillators such as CsI:Tl. In this work, we demonstrate a baseline prototype for the bottom layer—a continuous, large area
$83~\mu \text{m}$
pixel pitch flat panel indirect detector with well-established amorphous selenium as the photodetector—and verify the architecture’s performance and detector design. We characterize lag, noise-power spectrum, detective quantum efficiency, and modular transfer function of the detector, and show resolution up to 6 lp/mm when operated at an applied bias of 150 V. This provides a starting point for evaluating the alloyed selenium materials, and shows promise for this detector in the future dual-layer design.