Attest: Non-Destructive Identification of Counterfeit FPGA Devices

With ongoing microelectronic supply chain issues, the demand for genuine field-programmable gate arrays (FPGAs) is increasing - but so is the occurrence of counterfeit devices. Frequently, devices are used, salvaged from old systems, and repackaged as new. These recycled devices represent the largest class of counterfeit devices and are becoming more rampant. Therefore, it is often necessary to test whether a device is counterfeit before employing it in a new system. Current methods for evaluating the genuine nature of devices are frequently destructive, allowing for only small sample testing within lots. Other methods require complex external equipment and cannot be readily deployed throughout the supply chain. Graf Research Corporation has developed a methodology for using telemetry bitstreams to characterize an FPGA device and subsequently classify whether a device is a repackaged counterfeit via statistical and machine learning models. The new method utilizes minimal external equipment, is non-destructive, and can be employed at any point throughout the supply chain.