QVis: A Visual Analytics Tool for Exploring Noise and Errors in Quantum Computing Systems

We present the preliminary design and results of QVis, a visual analytics tool for exploring quantum device performance data. QV is helps uncover temporal and multivariate variations in noise properties of quantum devices. We describe the implementations of these methods as well as applications to the analysis of a 127-qubit data set derived from the IBM washington processor over a 16-month period. Both human-interactive and semi-automated analytic methods are included to address requirements for visual exploration, thresholding, and clustering techniques. Our application of QVis to real-world scenarios demonstrates the ability to reveal noteworthy patterns in the behavior of the critical characterization metrics.