Advanced Multiprobe Dual-Polarized Arch System for Microwave Reflectance Measurement

This article proposes a new dual-polarization multiprobe arch measurement system with a 2–18-GHz measurement frequency range. The basic principle of the arch measurement system is reviewed, and the hardware is introduced in detail. Based on the simulated results, the time gating method is presented, proving a useful way to reduce spurious coupling and clutter interference. The proposed arch measurement system is implemented, and some materials, such as commercial PTFE, FR-4, and customized paper-based honeycomb N15, are measured for verification. The results based on our proposed method have approximately ±2-dB amplitude differences and 1-GHz frequency shift compared to those results based on the RCS method and approximately 5-dB amplitude differences and 2-GHz shift compared to those results based on another customized arch system. The calculated uncertainty of the whole system is less than 4 dB, and the measurement time of a single sample is within 2 min. The proposed measurement system has remarkable advantages, such as high measurement accuracy, fast measurement speed, and wide application range.