A Dual-Polarized Electronically Scanned Reflectarray Based on 2-bit Reconfigurable Element

In this paper, a dual-polarized electronically scanned reflectarray based on 2-bit reconfigurable element is proposed. By loading five PIN diodes on the element, a tunable phase shift is realized in dual polarizations. The simulated results indicate that the element has a 2-bit phase resolution and low reflection loss less than 0.9dB at 13.5GHz. Moreover, a 16◊16 reflectarray based on the proposed element is designed. A wide beam scanning range, up to ±60°, is achieved in both polarizations.