Intelligent electronic information equipment maintenance and testing system based on general test instruments

This paper mainly aims at the problems such as poor compatibility and universality of current electronic information equipment (equipment) maintenance and testing equipment and weak customization and expansion ability, and changes the previous "one-to-one" special equipment development mode for specific types of equipment. An intelligent and open general maintenance testing system for electronic information equipment based on the mode of "universal test instrument + open test planning + broad spectrum adapter" is proposed to realize the intelligent maintenance testing and universal compatibility of electronic information equipment.