Relationships Between Distribution of Dislocation Glide Planes and Carrier Recombination Properties in InGaAs Solar Cells Using Microwave Photoconductivity Decay Mapping and Photoluminescence Spectroscopy

We investigated the relationships between the distribution of dislocation glide planes and carrier recombination properties in InGaAs solar cells with different open-circuit voltage (VOC) using microwave photoconductivity decay and photoluminescence measurements. The results showed the low VOC was due to the recombination of the photoexcited carriers with the dislocation-related defect.