Digital Assisted Defect Detection Methods for Analog and Mixed Signal Circuits: An Overview

The demand for reliable and defect-free electronics is growing steadily, driven by the requirements of mission-critical industries like automotive, space, and medical sectors. While there have been substantial advancements and extensive research focused on defect detection in digital circuits over the past four decades, the importance of defect detection in analog circuits has gained prominence more recently, primarily due to the increased utilization of electronic components in the automotive industry. This work aims to provide a concise review of several defect detection techniques for various analog and mixed-signal (AMS) circuits, employing digital control and monitoring circuits. This review aimed to encompass various analog and mixed-signal (AMS) circuits, including operational amplifiers (Op Amps), Successive Approximation Register (SAR) Analog-to-Digital Converters (ADCs), conventional LDOs (low-dropout regulators), fast transient flipped voltage follower (FVF) LDOs and Phase Locked Loops (PLL). By employing digital control and monitor circuits, the discussed methods harness the strengths of digital circuits, such as precise control, ease of analysis, and efficient testing. This utilization of digital circuitry in defect detection for analog circuits allows for improved accuracy, enhanced reliability, and simplified implementation.