Design and Qualification of a High-Speed Low-Power Comparator in 40 nm CMOS Technology

This paper presents the design methodology, test setup and experimental qualification results of a high-speed low-power threshold comparator in 40 nm CMOS technology intended for the registry of particles landing on a PIN-detector surface in particle detector readout electronics. The operation of the designed comparator is experimentally qualified for ideal digital pulses and analog signals generated by the preceding stages in a targeted potential application.