Radiofrequency Measuring Receiver with Spectrum Analyzer Function as a Tool for Noise Measurement of Semiconductor Structures

The article describes the measurement apparatus consisting of a measuring radio frequency receiver working as a spectrum analyzer and specially made amplifiers with very low input noise for the measurement of broadband electrical noise in semiconductor structures and is intentional to measure new structures made of two-dimensional lattices of covalent- and metal-organic frameworks (2D-COF/MOF), belonging to the Dirac family of materials, intended for the construction of the quantum Hall resistance standard (QHRS). The measuring setup operates in the frequency range from 10 kHz to 100 MHz. The implemented variant of the ultra-low noise amplifier (ULNA) improves the noise factor of the receiver five times and allows to obtain of a noise figure value at a level of 0.35 dB. This work proves the usefulness of the EMC receiver in measuring electrical noise using its spectrum analyzer as a modern tool in the search for cross-frequency at the crossover of pink 1/f noise and white noise frequency characteristics if the special construction device like the ULNA is connected at the input of the analyzer.