NVIDIA Jetson TX2i TID and Proton SEE Testing: Results and a Comparison of Two Proton Beam Facilities

The NVIDIA Jetson TX2i system-on-module has been radiation tested by The Johns Hopkins University Applied Physics Laboratory. APL tested the devices both for Total Ionizing Dose and proton sensitivity. APL's TID test indicated continuously powered parts fail between 15–25 krad(Si)., though devices failed on reboot if power was removed after 9.7 krad(Si). An unpowered-during-irradiation part failed between 45 and 50 krad(Si), but later had function restored. APL's proton test indicated sensitivity, with both nondestructive and destructive Single Event Effects observed: multiple reboots were required to clear errors, and all four tested boards ultimately failed to boot after a cumulative fluence between
$1.95\mathrm{x}10^{9}$
and
$4.37 \ \mathrm{x} \ 10^{9}$
protons/cm-
²
. Error and failure attributions are presented based on post-processed log data acquired during the proton test, implicating the flash memory as a probable cause of the destructive failure. Test parameters and results are compared with those of the recent University of Georgia proton test, further supporting the failure attribution to the flash chip.