Single Event Effects Characterization of the GR716A Rad-Hard LEON3FT Microcontroller

GR716A is a mixed-signal radiation-hardened Microcontroller built around a LEON3FT fault-tolerant processor developed by Frontgrade Gaisler. The development of the GR716A was initiated and funded by the European Space Agency within the Embedded Microcontroller for Space Applications activity. The GR716A is implemented using Imec's DARE180 radiation-hardened cell library in a 180 nm CMOS technology platform from UMC. This work presents the SEE characterization of the GR716A Microcontroller based on data collected from irradiation test campaigns performed by Frontgrade Gaisler. The results show an overall SEE error rate below 7.0x10-6 events/device/day for typical space orbits and a SEL immunity up to an LET of 125 MeV.cm
²
/mg,