BLT-Based Field Coupling to Microstrip Network Model Enabling Radiated Immunity Assessment for PCB Wiring Design

This paper proposed a statistical approach for assessing the radiated immunity of microstrip networks. For this purpose, electromagnetic field coupling to PCB is formulated by exploring the Baum-Liu-Tesche (BLT) equation, where special attention is focused on the field multi-reflections in dielectric substrate layer. Owing to the computational efficiency of deterministic model, a Monte-Carlo simulation is proposed to predict the statistical distributions and upper bound of terminal voltage across microstrip networks. The approach is then applied to compare the radiated immunity of canonical wiring layout design, which offers guidelines for improving microstrip designs.