Long-Term Reliability of PDN Design Based on Decap Aging and Temperature

The Power Delivery Network (PDN) of an electronic system in a data center is an important design portion that ensure the proper current supply and functionality of the active components. Its performances are affected by the temperature and aging of the PDN components, mainly the decoupling capacitors, thus the long-term reliability of the PDN requires high-level of attention to be able to predict how much its performances differ from the nominal design. A realistic test case is analyzed in this paper and a statistical prediction methodology is developed to effectively dealing with the long-term PDN degradation.