Comparison of a Power Cycling Test using Repetitive Unclamped Inductive Switching for Heat Generation with the DC Power Cycling Test

A power cycling test using repetitive unclamped inductive switching to generate heat is applied on low voltage silicon MOSFETs. The motivation of this approach is to introduce avalanche-generated losses, besides the conduction losses, so that the required load current can be reduced. This is important in testing low voltage MOSFETs, whereby the small on-state resistance often demands that the rated current be exceeded to achieve the desired temperature swing. The performance of this test approach is compared to that of a classical DC power cycling test in body-diode mode. The results obtained from these two tests – both lifetimes and failure modes – are found to be similar. The switching test required only 42% of the load current of the DC test. The static parameters of the devices deployed in both tests also showed similar changes.