Breakdown Thresholds Prediction for Microwave Devices with Pulsed Excitation and Temperature Effects

This paper presents an accurate and efficient method to analyze the air breakdown of microwave devices under high-power microwave. The spectral element time-domain(SETD) method has employed to analyze the breakdown threshold in the cases of different pulsed excitations and ambient temperatures. The numerical results show that the microwave breakdown threshold for pulsed excitation is larger than that for continuous waves at the same pressure, and the change in temperature leads to a shift in the Paschen curve. In addition, the proposed method is computationally more efficient than SPARK3D with the same accuracy.