Polynomial Chaos-Based Yield Optimization of Three-Pole H-Plane Filter

Yield optimization aims to find high-yield designs of microwave components under the uncertainties in the production process. However the Monte Carlo-based yield optimization requires extensive electromagnetic (EM) simulations. In this paper, the polynomial chaos (PC) expansion is used to construct the surrogate model of the EM responses. By combining the PC coefficients with the objective function, the objective function is related to the optimization variable. This approach allows for reliable yields and uses fewer EM simulations compared to the Monte Carlo-based yield optimization method.