Characterization of Bias-Dependent Ceramic Capacitors From Reflection Coefficient Measurements Performed Using a VNA

Multilayer ceramic capacitors are characterized using one-port network analyzer measurements. The proposal allows determining the bias-dependent capacitance and the series parasitics by using a single test fixture. For this purpose, the inaccuracy introduced by the bias-dependent response of the circuitry internal to the equipment is avoided through an external bias network. Moreover, since low-frequency measurements are required for characterizing capacitors of microfarads, capacitance extractions at frequencies as low as 40 kHz are performed to verify the usefulness of the methodology. Moreover, the practical bandwidth of test fixtures for small and large ceramic capacitors is defined through measurements up to 10 GHz.