Broadband Dielectric Characterization of Glasses and Other Silicates up to the THz Frequencies

The dielectric characterization of silicate materials up to 2.5 THz is presented in this paper, to try to fill up the THz gap between electrical and optical measurements. Several measurement techniques have been employed to provide a broadband response. Materials in the silicate family can be classified as amorphous or crystalline. The internal structure, as well as the composition of the material, influences the dielectric properties. The loss of a material depends on its crystallinity, with higher crystallinity exhibiting lower loss.