Unified Analog Mixed-Signal Defect Simulation and Applications

Ensuring test program readiness, efficiency of post-fabrication debug/diagnostics, test cost and quality entitlement are critical vectors contributing to the success of analog and mixed-signal (AMS) ICs, In this paper we will discuss some of the impactful recent developments in analog defect/fault simulation (AFS) that is at the center of all of these vectors. The features that we will discuss include the following: a) Unified analog and digital fault simulation framework to enable holistic and efficient analysis of AMS designs; b) Utilising physical design i.e., layout information to improve practicality and efficiency of AFS campaign. The need, application challenges, solutions to overcome them and possible future directions will be highlighted through appropriate industrial case studies.