The 41st IEEE VLSI Test Symposium

The 41st IEEE VLSI Test Symposium (VTS) was held in San Diego, CA, USA, on 24–26 April 2023. This venue was the first in-person one since the COVID-19 pandemic. VTS is one of the premier conferences focusing on test, reliability, and security challenges in VLSI circuits. Following the same trend as prior years, VTS was arranged in three days and captured a set of research and innovative practice (IP) sessions, keynotes, panels, embedded tutorials, and doctoral thesis competitions for a total of 31 sessions.