High-Frequency Aging Model Modeling Method of Passive Devices in EMI Filter Based on Electromagnetic Field Analysis

Power electronic devices must be certified for electromagnetic compatibility compliance before mass verification. However, this test does not consider the influence of aging factors, leaving hidden risks to electromagnetic compatibility. In this article, the passive device in the electromagnetic interference filter is taken as the research goal, and a lumped parameter high-frequency aging model with physical significance is established based on the electromagnetic field analysis. The proposed model has the ability to accurately describe the high-frequency characteristics of passive devices from 150 kHz to 30 MHz. At the same time, this article proposes a parameter extraction method for practical design. Based on the existing accelerated aging experiments, only one additional high-frequency characteristic measurement is required to predict the aging characteristics of passive devices. The proposed method achieves the prediction of high-frequency aging characteristics of passive devices within confidence intervals. Experiments verify the accuracy and correctness of the model, which can be applied to electromagnetic compatibility design considering aging.