Near-Field Diffuse Scattering Measurement Technique for Use With Effective Roughness Model

A compact method for extracting the parameters of the effective roughness model is introduced, which predicts statistical field scattering from rough surfaces. The proposed method includes quasi-plane wave generation using a parabolic reflector, sampling the near-field data, transforming the near-field data to the far field, and fitting using a cost function that provides for a greater contribution from the diffuse scattering than conventional methods. The proposed method was validated through a set of experiments using two materials under test with distinct roughness characteristics at 40 GHz. The scattering patterns were measured, and the directive model parameters were extracted using conventional and proposed methods. The results were compared to show that the proposed method is consistent with the conventional results, confirming its validity. The proposed method combines the advantages of a compact range and near-field measurements and can be used as an effective technique for extracting site-specific model parameters within indoor environments across mm-wave bands.