Performance Degradation and Reliability Evaluation of Domestic Operational Amplifier

Integrated circuit (IC) is complex in construction and function critical. How to ensure the reliability of chips in long-term use is the focus in this field, especially for the current domestic chips. In this paper, the reliability test and quantitative evaluation method of IC chips are studied with the domestic operational amplifier (op-amp) as the research object. The main performance parameters of op-amp are determined, and the online test system of op-amp is designed. Then the performance testing, enhancement testing and accelerated degradation test are carried out. Considering the uncertainty of degradation process, Wiener process was used to fit the degradation model of chip, and the calculation method of reliability was given. The research results of this paper provide a reference for quantitative evaluation of the quality and reliability of domestic components.