The Poynting Vector in Light-Emitting Multilayer Micro/Nanostructures: Wavelength-Scale Analysis by the Method of Single Expression

The Poynting vector is a unique mathematical expression that describes electromagnetic energy flow. It allows monitoring and observing specific features of electromagnetic waves’ interaction with confined structures. Calculation of the Poynting vector outside of any confined structure is feasible without difficulty. However, with the advent of modern photonics, there is a necessity to have information about energy flow within micro/nanostructures, consisting of dielectric, semiconductor or metallic nano-layers. Apparently, this information is attainable only numerically. Application of widely accepted approach of counter-propagating waves within confined multilayer structures is cumbersome for this type of analysis. An advantage of the method of single expression (MSE) is its high suitability in monitoring distributions of the Poynting vector and electric field within any multilayer structure. In the current work we make use of this advantage of the MSE to identify optimal configuration of 1D reflective type light-emitting microstructures. The RCLED with metallic back mirror is analysed numerically by the MSE.