Efficient Implementation of the Vector-Valued Kernel Ridge Regression for the Uncertainty Quantification of the Scattering Parameters of a 2-GHz Low-Noise Amplifier

This paper focuses on the application of an efficient implementation of the vector-valued kernel Ridge regression (KRR) to the uncertainty quantification (UQ) of the scattering parameters of a low-noise amplifier (LNA). Specifically, the performance of the proposed technique have been investigated for the statistical assessment of the mean value, variance and probability density function (PDF) of the
$S_{11}$
and
$S_{21}$
parameters of a 2-GHz LNA induced by 25 stochastic input parameters and compared with the corresponding reference results computed via a plain Monte Carlo (MC) simulation.