Memristor Testing Needs Compared to Existing CMOS Testing Methods

This paper provides a comparison of established CMOS circuit testing concepts to the existing memristor testing efforts to identify memristor circuit testing needs. A very brief review of many CMOS testing concepts is provided to give a basis for comparison with memristor testing. A short simple overview of memristor theory precedes a survey of existing memristor testing efforts. Specifically, an analysis of testing sneak paths for fault detection and fault diagnosis is presented. A list of concepts that are equally applicable to both CMOS and memristor technologies have been described and those unique to memristor circuits have been identified.