Establishing a D-Band Waveguide Impedance Standard Including the Random Effects of a Vector Network Analyzer for 6G Wireless Communications

This article describes an established
${D}$
-band waveguide impedance standard. The eight-term vector network analyzer (VNA) error model is used for our measurement system. A set of shims, a flush short, thru, and a reciprocal device are used as calibration standards to determine the error coefficients of the VNA error model. From the measured raw scattering parameters and dimensions of each shim, the error coefficients of the error model, the propagation constant of the shim, and the reflection coefficient of the flush short are found using nonlinear optimization. Then, we evaluate the uncertainty in the scattering parameter measurement by combining the fitting uncertainty, the dimension uncertainty of the shims, and the random effects of the VNA into the residual uncertainty model. Finally, we calculate the calibration and measurement capabilities (CMCs) of our measurement system.