Research on Determination Method of Allowed Residual Defect from Electronic Product in Batch Production

To solve the determination problem of the allowed residual defects from electronic product in batch production, according to the different data base of products, determination methods of allowed residual defect in electronic product are given in this paper combined with engineering practice. The determination methods of allowed residual defect in electronic product are given based on conditional probability method, mixed distribution method and failure rate definition, when the historical data or similar product data are enough; the determination method of allowed residual defect in electronic product is given based on yield definition, when the historical data or similar product data are lacking.