A X-band probe for phaseless near-field measurements

The design of a multifrequency integrated probe performing phaseless near-field measurements is presented. Two X-band rectangular waveguides directly connected to a microstrip circuit are used for making the near-field scanning which provides the necessary amplitude information. An interferometric algorithm is applied in conjunction with a minimization procedure to obtain the unknown near-field phase. A prototype of the probe has been realized and successfully tested on a standard X-band pyramidal horn.