Abstract:
The boundaries that determine the Ldmos safe operating area are described and are shown to be predominantly thermal or electrical in origin. Methods of characterizing and...Show MoreMetadata
Abstract:
The boundaries that determine the Ldmos safe operating area are described and are shown to be predominantly thermal or electrical in origin. Methods of characterizing and analyzing the related thermal SOA and electrical SOA are illustrated. The impact on device size and related trade-offs with breakdown voltage and specific on-resistance are discussed, as are possibilities for improving SOA performance.
Published in: Proceedings of the 14th International Symposium on Power Semiconductor Devices and Ics
Date of Conference: 07-07 June 2002
Date Added to IEEE Xplore: 07 August 2002
Print ISBN:0-7803-7318-9
Contents 