Investigation of Quality and Identity of Similar Electronic Components from Different Manufacturers

This research studies the failures of electronic equipment due to the use of low-quality electronic components. This work identifies the actual specifications of semiconductor components (MOS transistors) with the same labeling from different manufacturers and checks their compliance with the manufacturer datasheets. The widespread occurrence of radioelectronic devices using semiconductor components, in particular, transistors, makes providing a reliable element base a relevant goal for their production. The need to conduct the research arose because of the increasing number of electronic equipment failures, as well as the by the recurrent adjustment and refining for experimental devices during their development. The analysis of the failures showed that the selection of faulty equipment correlated with the batches of electronic components used for its production. The purpose of this research work is to establish the correlations between the parameters of electronic components from various manufacturers to their specifications stated in datasheets. The key methods of this research work include the analysis of the information available on MOS transistors, forecasting, experimentation, observation, accumulation, analysis, and digitalization of the obtained data on transistor operation. It also involved the visualization of the results, drawing conclusions, and providing recommendations. The obtained actual operation parameters of MOS transistors demonstrate that same-type transistors from different manufacturers differ significantly. In some cases, components can be deemed defective. The research conducted showed that the stated datasheet parameters of components do not comply with the experimental values. Basing upon the research results, the authors provide some recommendations on the organization of the acceptance test of electronic components for the electronic equipment production.