Study on high temperature storage reliability of crystal Oscillator

As the most accurate and stable oscillator, the crystal oscillator can provide a stable frequency signal source for the circuit. It has an extremely wide range of applications in various digital circuits and precision instruments, and is an important type of frequency control device. In the field of military and aerospace, crystal oscillators not only require good frequency accuracy and stability under long-term working conditions, but also require high storage reliability, which can meet the storage life requirements of products. In this paper, a high-temperature storage reliability study was conducted for a certain model of crystal oscillator. The high-temperature storage reliability test was designed and carried out. Through the degradation analysis and failure analysis of the test samples, the degradation trend of this model of crystal oscillator under high-temperature storage conditions and the failure mechanism of the leakage failure caused by the galvanic corrosion at the internal solder joints were found. The study in this paper has certain reference significance for the reliability research of crystal oscillator.