Quality assessment of analog to digital converter chip using test data set

Analog to Digital Converter (ADC) chip test generates a test data set including several dynamic parameters at various frequency. It is a challenge to obtained its quality quantitatively from test data set due to its high dimension and various units. This paper develops a method named quality-spectrum to analyzing ADC quality characteristics using its data set. It displays all variation of test parameters on one picture. Meanwhile, the relationship among these parameters could be quantatitived through three viewpoints which is chip, parameter and frequency. First, define classifier rule according with the characteristics of ADC chip. Second, form the quality-spectrum which is a digital color image by mapping the test data set to a classification matrix Q and color it. Last, obtain the chip's quality distribution quantitatively by calculating the fault score of classification matrix Q from different dimensions. The quality characteristics distribution of ADC chips could be observed directly and calculated quantitatively through quality-spectrum. A test data set of ADC chip is used to verify the validation of this method.