A Statistical Assessment of Zener Diode Behavior Using Functional Data Analysis

This paper presents an assessment of electrical device measurements using functional data analysis (FDA) on a test case of Zener diode devices. We employ three techniques from FDA to quantify the variability in device behavior, primarily due to production lot and demonstrate that this has a significant effect in our data set. We also argue for the expanded use of FDA methods in providing principled, quantitative analysis of electrical device data.