New Real-Time Fluence Correction Method With SRAM Dosimeter for High Accuracy Single-Event Upset Evaluation

For the first time, we propose a single event effect (SEE) Equipment System with a reference static random access memory (SRAM) dosimeter, and provide the empirical correlation equations and real-time effective fluence (RTEF) with software for analysis. Quality Reliability Technology (QRT) SEE Equipment System can make and provide the radiation-beam-fluence information based on soft error count. We clarified that measurement results of soft error count with SRAM dosimeter show a high correlation factor of 0.965 with neutron fluence of Los Alamos Neutron Science Center (LANSCE). According to the correlation equation verified at LANSCE, we extrapolated regression analysis of radiation test data to different radiation facilities without beam profile information for real-time beam analysis. When using an SRAM dosimeter for detecting beam profile characteristics, exact data can be obtained if the radiation sensitivity of SRAM is measured and compensated. From this perspective, we distinguished SRAM’s radiation sensitivity from the beam profile using a step-wise scan test sequence, and accurate fluence which only contains a profile of the beam itself could be obtained. On the dosimeter, we uniformly arranged 41 SRAMs, which can cover the entire beam size of LANSCE Irradiation of Chips Electronics-II (ICE-II), 76.2 mm, and derive a more accurate correlation equation.