Ir Film Structural Properties for TES Application

Iridium films grown by pulsed laser deposition (PLD) show different critical temperatures (
T_c
), which can be almost twice the
T_c
of the bulk. This difference is related to the thickness and deposition conditions. To understand this effect, we grew different films with different configuration parameters: laser focusing, distance to the Ir target, and deposition time. We then measured the
T_c
and analyzed the film with structural measurements by X-ray diffraction (XRD), looking at a possible correlation with the grain size of the film itself. The work was performed to determine the film growth conditions at which it is possible to obtain predetermination of
T_c
with good accuracy using XRD pattern characteristics of Ir films.