A Surface Integral Equation-Based Sub-Structure Characteristic Mode Analysis Method for Printed Circuit Structures

In this work, the electric field integral equation coupled Poggio-Miller-Chang-Harrington-Wu-Tsai equation-based sub-structure characteristic mode (CM) formulation is proposed to analyze the resonant behaviors of printed circuit structures. Superior to the full-structure (sub-structure) volume-surface integral equation (VSIE)-based CM analysis method, the surface integral equation (SIE)-based CM analysis method only needs the surface discretization of targets. The proposed method greatly reduces computational cost, and numerical examples validate its accuracy.