Automatic Output Method of Adhesion Spectrum Based on Atomic Force Microscope

On the basis of the existing AFM system, in view of its shortcomings such as the randomness of taking points in indentation test and the lack of intuitiveness of the results, it was improved to complete the operation in the selected area and extract the force-distance curve. The method of singular value decomposition and wavelet transform is used to denoise the curve. According to the curve characteristics, the universal model between force and distance is obtained by fitting with the least square method, from which the adhesion index is extracted. The adhesion index obtained is converted into pixel points through the formula and printed on the corresponding grid to obtain the adhesion map. The spectral output method has a high degree of automation and is proved to have a high accuracy by single point verification.