Highly Accurate Measurement of Contact Resistance Between Galinstan and Copper Using Transfer Length Method

We have studied a measurement configuration for highly accurate measurement of the contact resistance (R
c
) between gallium-based liquid metals (LMs) and solid metals (SMs) using the Transfer Length Method (TLM). In the conventional TLM, target materials with low conductivity are used as wiring and contact to SM electrodes with high conductivity. However, since LMs have almost the same conductivity as SMs, the measurement configuration for LMs is not obvious. We compared the measurement configurations of LMs and SMs. As a result, we found that the R
c
for the configuration of SM wiring and LM electrodes was six times higher than that of LM wiring and SM electrodes. Our method accelerates research on LM interfaces and provides new opportunities for the development of stretchable electronics using LMs.