Medium-Earth-Orbit Spaceflight Radiation Effects in Triple Modular System on Programmable Device

This work presents experimental results of medium-Earth-orbit (MEO) spaceflight radiation effects in a commercial off-the-shelf (COTS) static random access memory (SRAM)-based field programmable gate array (FPGA) device implementing a case-study digital system design protected with the classical triple modular redundancy (TMR) technique. This UGA/TIMA’s experiment is a part of the NASA/GSFC’s space environment testbeds (SETs) payload launched in the AFRL’s demonstration and science experiments (DSX) spacecraft in June 2019. Results report 69 single-event upset (SEU)-induced failures in the TMR-protected case-study system, moreover total ionizing dose (TID) effects for nearly two years of space mission seem not to contribute to an increment of SEU-induced failures.