I. Introduction
In the manufacturing of organic light-emitting diode (OLED) or liquid crystal display (LCD) panels, the Mura defect, also called a stain defect occurs quite frequently [1]. The defect is very difficult to detect via the naked eye because it has a contrast that is similar to the background, and it consists of various sizes, from very small (a few pixels) to very large (covering half of panel). Currently, camera inspection is the most popular method for obtaining accurate functional defect identification [2], [3], [4], [5]. However, one of the greatest problems in camera inspection is that captured images are often contaminated with moiré patterns as shown in Fig. 1(a).
Mobile display Mura images taken using various camera settings. (a) Mura image with a moiré pattern taken by an in-focus camera, (b) blurred Mura image without a moiré pattern taken by an out-of-focus camera, and (c) deblurred result using the proposed method.