Adaptive Granularity On-die ECC | IEEE Conference Publication | IEEE Xplore

Adaptive Granularity On-die ECC


Abstract:

DRAM vendors have introduced on-die ECC (Error Correction Codes) to protect memory from errors. The current on-die ECC provides weak Single Error Correction (SEC) protect...Show More

Abstract:

DRAM vendors have introduced on-die ECC (Error Correction Codes) to protect memory from errors. The current on-die ECC provides weak Single Error Correction (SEC) protection, yet growing errors demand stronger protection. This paper proposes a novel memory protection scheme called Adaptive Granularity On-die ECC (AGO-ECC). AGO-ECC adjusts access granularity and ECC protection strength based on memory locality and reliability requirements. For critical or high-locality data, AGO-ECC increases the granularity and applies Triple Error Correction (TEC). AGO-ECC can improve not only reliability but also performance.
Date of Conference: 19-22 October 2022
Date Added to IEEE Xplore: 07 February 2023
ISBN Information:
Print on Demand(PoD) ISSN: 2163-9612
Conference Location: Gangneung-si, Korea, Republic of

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