Simulation Analysis of the influence of electromagnetic Pulse Power on the performance degradation of CMOS Inverter

The strong electromagnetic pulses generated by nuclear explosions and electromagnetic pulse weapons can interfere radar system by damage the integrated circuit in the system. With the increasing of integrated circuit integration and the continuously reducing of the device feature size, the damage effect of electromagnetic pulse on the integrated circuit becomes more and more obvious. The electromagnetic pulse damage effect of integrated circuit is mainly reflected in the thermal field in the integrated circuit. Aiming at the electromagnetic pulse damage law of integrated circuits, CMOS inverter is researched. The device simulation software Sentaurus is then used to establish the inverter model. Then the effects of the power and pulse width of the injected electromagnetic pulse on the performance of the inverter are studied. The simulation results show that when the power is low, the performance of the inverter is only temporarily interfered, and its operation can resume normal when the EMP no longer acts. When the power reaches a certain threshold, the performance of the inverter will be permanently damaged. The larger the pulse width, the smaller the damage threshold of the inverter.