Investigations on Ionizing Dose Deposition in Thin-Layered Devices: Sample-to-Sample Variability and Electronic Equilibrium Dependence

The impact of photon energy spectrum on dose deposition variability is investigated using dosimetry, charge collection experiments on electronic and optoelectronic devices, and radiation-induced attenuation (RIA) measurements in optical fibers. Geant4 calculations are performed to discuss the influence of photon energy spectrum, sensitive layer thickness, and irradiated material. Implications for radiation test of electronic and optical equipment are discussed to ensure that the effective total ionizing dose (TID) is reached in irradiated devices.