Cryogenic Measurement of CMOS Readout Circuit Integrated with Silicon-based Blocked-Impurity-Band Detector

This article proposes a readout integrated circuit (ROIC) for the blocked-impurity-band (BIB) Terahertz (THz) detector, which is operated in the cryogenic (≤6K) environment. This ROIC was designed based on a cryogenic PDK model and used the capacitance trans-impedance amplifier (CTIA) as the input stage. The circuit chip integrated with BIB detector chip was measured at 6K temperature, which avoided the freezing-out effect or kink effect and work normally. The linearity of the chip reaches 97.7%, and the injection efficiency is higher than 95%. Our results provide a potential CMOS readout circuit, which can be used for the cryogenic detector like BIB and other kind of cryogenic device.