Susceptibility of microcontrollers to ultra-short pulse electromagnetic interferences under the temperature influence

This paper presents the results of investigations of susceptibility of microcontrollers ($\mu$C) and flash memory to combined temperature and electromagnetic influence. The influence of electromagnetic interference was studied in a TEM cell placed inside a heat-cold chamber, in the temperature range from minus 50 to 105°C. The method of testing the $\mu$C included 5 stages; 60 test runs were performed without temperature influence, and 120- with it. In addition, the main requirements to the $\mu$C test program were formulated, and the methodology for detecting failures was developed. The failures in the $\mu$C are detected by analyzing and comparing the memory dump before and after the excitation of external electromagnetic interference in the form of an ultra-short pulse. It is shown that such excitation leads to software failures and data changes in the flash memory, while the combined temperature and electromagnetic influence leads to software failures without data changes in the flash memory.