Yield-Driven Antenna Design Using Principal Directions

The capacity to quantify the implications of fabrication inaccuracies is fundamental to improve antenna design immunity to limited accuracy of manufacturing procedures and technological spread of substrate permittivity or other material parameters [1]. Degradation of electrical and field properties due to geometry parameter deviations often manifests itself as center frequency shifts, increased axial ratio levels for circularly polarized antennas, or compromised impedance matching. Improving antenna performance at the presence of uncertainties is typically realized through maximization of the fabrication yield [2],[3].