Optimization of Operating Parameters for the Determination of Normalized Components in Thin Films Based on Trivalent Chromium and Titanium by the FP Method RFA

Actual tasks are to study the possibility of conducting RFA of passive films by the FP method and to develop a possible method for the production of control samples of films, the solution of which will significantly increase the precision, profitability, and safety of analysis. The method of X-ray fluorescence analysis provides the simultaneous determination of a large number of elements in a wide range of concentrations, rapid measurements.